A functionalization-free plasmonic hole-sphere nanogap SERS platform for reliable on-site analysis and oxide-state classification

  • Kim, Minjun
  • Heo, Damun
  • Cho, Sung Yoon
  • Lee, Ye-Won
  • Gu, Sun-Hwa
  • ... Kim, Hyuck Soo
  • 외 7명
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초록

Developing plasmonic nanogaps via simple, lithography-free methods is essential for advancing practical surface-enhanced Raman spectroscopy (SERS) sensors. Here, we present a functionalization-free, lithography-free plasmonic hole-sphere nanogap (HSNG) platform, enabling sensitive differentiation of oxidation states at trace levels. The HSNG structure, fabricated by straightforward thermal annealing and metal deposition, achieves highly uniform nanogaps (signal deviation <15%), resulting in a strong (similar to 108) and uniform Raman enhancement. The fully metal-coated nanocavity structure eliminates background interference, significantly enhancing the analytical reliability in complex environmental samples. Using this platform, we demonstrated the ability to distinguish trace concentrations of As3+ and As5+, which were difficult to distinguish with conventional gold nanoparticles due to low signal intensity, at the on-site analysis level. Remarkably, reliable oxidation state identification remains possible even under reduced spectral resolution, ensuring compatibility with simplified detection setups such as bandpass filters or smartphone-based spectrometers. This HSNG-based SERS platform provides a scalable, accessible, and field-applicable approach to chemical sensing, readily extendable to the detection of diverse environmental contaminants.

키워드

ENHANCED RAMAN-SPECTROSCOPYELECTRON-BEAM LITHOGRAPHYTOXICITYFIELD
제목
A functionalization-free plasmonic hole-sphere nanogap SERS platform for reliable on-site analysis and oxide-state classification
저자
Kim, MinjunHeo, DamunCho, Sung YoonLee, Ye-WonGu, Sun-HwaAdhikari, SamirLee, DonghanJeong, Seok SoonKim, Hyuck SooDevaraj, VasanthanZentgraf, ThomasJeon, Min YongLee, Jong-Min
DOI
10.1039/d5nr03414k
발행일
2026-03-02
유형
Article
저널명
Nanoscale
18
8
페이지
4292 ~ 4299