A study of the effect of residual stress on magnetic properties of Fe-Ni thin film using a synchrotron X-ray

초록

Fe20Ni80 thin films, with a thickness of 0.7 mu m, were sputtered onto Si (111) single crystal and 40-mu m thick Ni79Fe21 ribbons were fabricated using the rapid solidification process (RSP). Annealing of Ni-Fe thin films and ribbons at various temperatures showed that the stress induced during the sample fabrication was relieved with a subsequent decrease in coercivity, which was determined from the measurements of magnetic properties using a vibrating sample magnetometer (VSM). Decrease in coercivity of Ni-Fe thin films and ribbons were strongly dependent on annealing temperatures. Also noted was a high correlation between residual stress reduction at different annealing temperatures and coercivity that magnetic properties are strongly influenced by residual stress induced in samples.

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