CaAl2Si2O8를 입계상으로 가지는 Al2O3 계면의 분자동력학 시뮬레이션

초록

Molecular dynamics simulations were performed to study interface structures between an Al2O3 crystalline phase and a interface phase of CaAl2Si2O8. We calculated atomic structures and excess interface energies in systems with different thicknesses of the interface film. It was found that excess interface energies at first readily decreased with increasing film thickness, but increased for larger thicknesses of more than 2 nm. The excess energies of Al2O3/CaAl2Si2O8 interfaces exhibit a minimum at a thickness around 1 nm. In this range of film thicknesses, the atoms in the interface film show a short-range ordered structure and slow diffusion rather than the random structure and rapid diffusion expected to an observation of an equilibrium thickness for interface films in ceramics.

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