Oxidation of rubrene, and implications for device stability

  • Ly, Jack T.; 
  • Lopez, Steven A.; 
  • Lin, Janice B.; 
  • Kim, Jae Joon; 
  • Lee, Hyunbok; 
  • 외 5명
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30
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30

초록

The rapid spontaneous photo-oxidation of rubrene to form endo-peroxide, rubrene-Ox1, was monitored via(1)H NMR and UV-vis spectroscopy. The reaction is thermally reversible, which restores high mobility devices in both the crystalline thin film and single crystal. Prolonged stirring in chlorinated solvents yields a secondary, irreversible product, rubrene-Ox2, which has lost phenol, as confirmed by single crystal analysis. An acid-catalyzed rearrangement of the endo-peroxide to form rubrene-Ox2 was identified here with Density Functional Theory (DFT). Implications of the nature of these processes for the preparation of organic transistors are described.

키워드

THIN-FILM TRANSISTORS; FIELD-EFFECT TRANSISTORS; PENTACENE PRECURSOR; CHARGE-TRANSPORT; HIGH-PERFORMANCE; SINGLET OXYGEN; GROWTH
제목
Oxidation of rubrene, and implications for device stability
저자
Ly, Jack T.; Lopez, Steven A.; Lin, Janice B.; Kim, Jae Joon; Lee, Hyunbok; Burnett, Edmund K.; Zhang, Lei; Aspuru-Guzik, Alan; Houk, K. N.; Briseno, Alejandro L.
DOI
10.1039/c7tc05775j
발행일
2018-04-14
유형
Article
저널명
Journal of Materials Chemistry C
권
6
호
14
페이지
3757 ~ 3761