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Oxidation of rubrene, and implications for device stability
- Ly, Jack T.;
- Lopez, Steven A.;
- Lin, Janice B.;
- Kim, Jae Joon;
- Lee, Hyunbok;
- 외 5명
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WEB OF SCIENCE
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30초록
The rapid spontaneous photo-oxidation of rubrene to form endo-peroxide, rubrene-Ox1, was monitored via(1)H NMR and UV-vis spectroscopy. The reaction is thermally reversible, which restores high mobility devices in both the crystalline thin film and single crystal. Prolonged stirring in chlorinated solvents yields a secondary, irreversible product, rubrene-Ox2, which has lost phenol, as confirmed by single crystal analysis. An acid-catalyzed rearrangement of the endo-peroxide to form rubrene-Ox2 was identified here with Density Functional Theory (DFT). Implications of the nature of these processes for the preparation of organic transistors are described.
키워드
THIN-FILM TRANSISTORS; FIELD-EFFECT TRANSISTORS; PENTACENE PRECURSOR; CHARGE-TRANSPORT; HIGH-PERFORMANCE; SINGLET OXYGEN; GROWTH
- 제목
- Oxidation of rubrene, and implications for device stability
- 저자
- Ly, Jack T.; Lopez, Steven A.; Lin, Janice B.; Kim, Jae Joon; Lee, Hyunbok; Burnett, Edmund K.; Zhang, Lei; Aspuru-Guzik, Alan; Houk, K. N.; Briseno, Alejandro L.
- 발행일
- 2018-04-14
- 유형
- Article
- 권
- 6
- 호
- 14
- 페이지
- 3757 ~ 3761
- 언어
- ENG
- 출판사
- ROYAL SOC CHEMISTRY
- 발행국가
- 영국
- 분량
- 5 페이지
- ISSN
- E 2050-7534
P 2050-7526