Modified Stoichiometry in Homogeneous Indium-Zinc Oxide System as Vertically Graded Oxygen Deficiencies by Controlling Redox Reactions

  • Tak, Young Jun
  • Rim, You Seung
  • Yoon, Doo Hyun
  • Kim, Si Joon
  • Park, Sung Pyo
  • 외 4명
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초록

The present study suggests a way to improve electrical characteristics and stabilities by forming a different stoichiometry in a homogeneous system without using a multiple deposition process. Post treatment by sequential pressure annealing (SPA) of a homogeneous indium-zinc oxide system is carried out to fabricate vertically graded oxygen deficiencies via redox reactions. The SPA treatment consists of several steps. First, hydrogen pressure annealing is performed to chemically expedite the reduction reaction of weak chemical bonds in the overall channel region and thereby make the material highly conducting. Second, oxygen pressure annealing is performed to render the channel a poor conductor by gradually oxidizing the channel from the back to the front. Such SPA-treated devices have significantly more oxygen deficiencies in the front-channel region than in the back-channel region. The stoichiometry of the channel region modified in this manner provided enhanced mobility, a higher on/off ratio, and a decreased threshold voltage shift (under positive and negative bias stresses).

키워드

THIN-FILM TRANSISTORSLOW-TEMPERATURESTABILITYPERFORMANCE
제목
Modified Stoichiometry in Homogeneous Indium-Zinc Oxide System as Vertically Graded Oxygen Deficiencies by Controlling Redox Reactions
저자
Tak, Young JunRim, You SeungYoon, Doo HyunKim, Si JoonPark, Sung PyoLee, HeesooKim, Woon GiYang, YangKim, Hyun Jae
DOI
10.1002/admi.201500606
발행일
2016-02-23
유형
Article
저널명
Advanced Materials Interfaces
3
4