Change in dielectric properties of sweet potato during microwave drying

초록

Sweet potato slices and strips (thickness of 6 and9 mm, respectively) as single layer were dried at differentmicrowave power levels (90 W to 900 W) in order todetermine the effect of microwave power and sample shapeon drying characteristics. Dielectric properties of sweetpotato slices were measured during microwave drying. Drying time for both samples was decreased with increasein microwave power, and drying time of strips was longerthan slices in the microwave power range between 90 and720 W. Page model was suitable for describing experimentaldrying data regardless of microwave power andshape of sweet potato samples. Dielectric properties ofsweet potato slices were decreased with a decrease inmoisture content. The change in dielectric properties ofsweet potato slices could be predicted by Henderson andPabis model and could be applied to estimate the change inmoisture content of sweet potato during microwave drying.

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