Surface structure of low-coveraged Cs on Si(001)-(2 x 1) system

  • Park, JY
  • Seo, JH
  • Kim, JY
  • Whang, CN
  • Kim, SS
  • 외 2명
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초록

Alkali metals (AM) on semiconductors have been investigated as a simple model system for the metal-semiconductor interfaces due to their simple electronic structures. Especially, cesium (Cs) on Si(0 0 1) surface has been studied with various experimental techniques. In this study, we investigated the atomic structure of initial Cs adsorption on Si(0 0 1)-(2 x 1) surface using coaxial impact collision ion scattering spectroscopy. When Cs atoms are adsorbed on Si(0 0 1)-(2 x 1) up to 0-2 ML at room temperature, the initial adsorption site is on-top T3 site with poor periodicity and the length of Si dimer is reserved as in the clean Si(0 0 1) surface. It is also found that Cs atoms adsorbed on Si(0 0 1) surface with a height of 2.83 +/- 0.05 Angstrom from the second layer of Si(0 0 1) surface. (C) 2004 Elsevier B.V. All rights reserved.

키워드

surface structuremorphologyroughness and topographysiliconcesiumalkali metalslow energy ion scattering (LEIS)ENERGY ELECTRON-DIFFRACTIONPHOTOELECTRON DIFFRACTIONSI(100)2X1ADSORPTIONSCATTERINGCESIUM
제목
Surface structure of low-coveraged Cs on Si(001)-(2 x 1) system
저자
Park, JYSeo, JHKim, JYWhang, CNKim, SSChoi, DSChae, KH
DOI
10.1016/j.apsusc.2004.06.144
발행일
2005-02-15
유형
Article
저널명
Applied Surface Science
240
1-4
페이지
305 ~ 311