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High-resolution electron microscopy on stacking faults in heteroepitaxial system
- 제목
- High-resolution electron microscopy on stacking faults in heteroepitaxial system
- 저자
- 임성환
- 발행일
- 2000-09
- 학회명
- Eighth Conference on Frontiers of Electron Microscopy in Materials Science
- 개최국가
- 일본
- 학회 개최일
- 2000-09 ~ 2000-09