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자료 필터
자료유형
발행연도
2000 ~ 2026
2000 2026
키워드
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전체 145건 중 71번부터 80번까지의 결과를 표시합니다.
2013
Article
Effect of V addition on hardness and electrical conductivity in Cu-Ni-Si alloys
- Han, S. Z. ;
- Gu, J. H. ;
- Lee, J. H. ;
- Que, Z. P. ;
- Shin, J. H. ;
- ... Lim, S. H. ;
- 외 1명
- 2013-07
- Metals and Materials International
- KOREAN INST METALS MATERIALS
Article
Effects of Ti addition and heat treatments on mechanical and electrical properties of Cu-Ni-Si alloys
- Kim, Hyung Giun ;
- Lee, Taeg Woo ;
- Kim, Sang Min ;
- Han, Seung Zeon ;
- Euh, Kwangjun ;
- ... Lim, Sung Hwan ;
- 외 1명
- 2013-01
- Metals and Materials International
- KOREAN INST METALS MATERIALS
2012
Article
Microstructural characterization of Ni-22Fe-22Cr-6Al metallic foam by transmission electron microscopy
- Kim, Hyung Giun ;
- Lee, Taeg Woo ;
- Lee, Jae Young ;
- Lee, Eui Sung ;
- Oh, Kwon ;
- ... Lim, Sung Hwan ;
- 외 1명
- 2012-10
- Journal of Electron Microscopy
- OXFORD UNIV PRESS
Article
Synthesis and Characterization of Rutile TiO2 Powder by the Sulfuric Acid Method
- Choi, Soon Ok ;
- Cho, Jee Hee ;
- Kim, Won Yong ;
- Lim, Sung Hwan
- 2012-07
- 대한금속·재료학회지
- KOREAN INST METALS MATERIALS
Conference
Synthesis of Si Nanoparticles from Porous Silicon for Lithium Ion Batteries
- 이성만 ;
- 임성환 ;
- 이관희 ;
- 김형균
- 2012-06-17
- 대한민국
Article
Microstructural study on effects of C-alloying on Cu-Fe-P cast alloy
- Kim, Hyung Giun ;
- Lee, Taeg Woo ;
- Han, Seung Zeon ;
- Euh, Kwangjun ;
- Kim, Won-Yong ;
- ... Lim, Sung Hwan
- 2012-04
- Metals and Materials International
- KOREAN INST METALS MATERIALS
2011
Article
Effects of C addition and thermo-mechanical treatments on microstructures and properties of Cu-Fe-P alloys
- Kim, Hyung Giun ;
- Han, Seung Zeon ;
- Euh, Kwangjun ;
- Lim, Sung Hwan
- 2011-12-15
- Materials Science and Engineering: A
- ELSEVIER SCIENCE SA
Article
Effects of alloying elements on microstructure and thermal aging properties of Au bonding wire
- Kim, Hyung-Giun ;
- Lee, Taeg-Woo ;
- Jeong, Eun-Kyun ;
- Kim, Won-Yong ;
- Lim, Sung-Hwan
- 2011-12
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD