김시준 프로필 사진

김시준

Kim, Si Joon

춘천캠퍼스

대학

IT대학

전기전자공학과

ORCID

연구분야

  • 반도체·디스플레이 소자 및 공정

자료 필터

자료유형

발행연도

2013 ~ 2026
2013 2026

키워드

언어

전체 158건 중 131번부터 140번까지의 결과를 표시합니다.

2019
Article

Stress-Induced Crystallization of Thin Hf1-XZrXO2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic Energy Storage Applications

  • Kim, Si Joon ; 
  • Mohan, Jaidah ; 
  • Lee, Joy S. ; 
  • Kim, Harrison Sejoon ; 
  • Lee, Jaebeom ; 
  • 외 5명
  • 2019-02-06
  • ACS Applied Materials & Interfaces
  • AMER CHEMICAL SOC
Article

Ferroelectric Hf0.5Zr0.5O2 Thin Films: A Review of Recent Advances

  • Kim, Si Joon ; 
  • Mohan, Jaidah ; 
  • Summerfelt, Scott R. ; 
  • Kim, Jiyoung
  • 2019-01
  • JOM
  • SPRINGER
2018
Article

Investigation of the Physical Properties of Plasma Enhanced Atomic Layer Deposited Silicon Nitride as Etch Stopper

  • Kim, Harrison Sejoon ; 
  • Meng, Xin ; 
  • Kim, Si Joon ; 
  • Lucero, Antonio T. ; 
  • Cheng, Lanxia ; 
  • 외 10명
  • 2018-12-26
  • ACS Applied Materials & Interfaces
  • AMER CHEMICAL SOC
Article

Low-voltage operation and high endurance of 5-nm ferroelectric Hf0.5Zr0.5O2 capacitors

  • Kim, Si Joon ; 
  • Mohan, Jaidah ; 
  • Kim, Harrison Sejoon ; 
  • Lee, Jaebeom ; 
  • Young, Chadwin D. ; 
  • 외 4명
  • 2018-10-29
  • Applied Physics Letters
  • AMER INST PHYSICS
Article

Robust SiNx/GaN MIS-HEMTs With Crystalline Interfacial Layer Using Hollow Cathode PEALD

  • Meng, Xin ; 
  • Lee, Jaebeom ; 
  • Ravichandran, Arul ; 
  • Byun, Young-Chul ; 
  • Lee, Jae-Gil ; 
  • ... Kim, Si Joon ; 
  • 외 4명
  • 2018-08
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Effect of film thickness on the ferroelectric and dielectric properties of low-temperature (400 °C) Hf0.5Zr0.5O2 films

  • Kim, Si Joon ; 
  • Mohan, Jaidah ; 
  • Lee, Jaebeom ; 
  • Lee, Joy S. ; 
  • Lucero, Antonio T. ; 
  • 외 5명
  • 2018-04-23
  • Applied Physics Letters
  • AMER INST PHYSICS
Article

Boosting Visible Light Absorption of Metal-Oxide-Based Phototransistors via Heterogeneous In-Ga-Zn-O and CH3NH3PbI3 Films

  • Tak, Young Jun ; 
  • Kim, Dong Jun ; 
  • Kim, Won-Gi ; 
  • Lee, Jin Hyeok ; 
  • Kim, Si Joon ; 
  • 외 2명
  • 2018-04-18
  • ACS Applied Materials & Interfaces
  • AMER CHEMICAL SOC