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자료 필터
자료유형
발행연도
2013 ~ 2026
2013 2026
키워드
언어
전체 158건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Unified Phase-Field Framework for Antiferroelectric, Ferroelectric and Dielectric Phases: Application to HZO Thin Films
- Pankaj, P. ;
- Sugathan, Sandeep ;
- Kim, Jiyoung ;
- Kim, Si Joon ;
- Cha, Pil-Ryung
- 2026-09
- Advanced Functional Materials
- WILEY-V C H VERLAG GMBH
Article
Resolving the Hydrogen Paradox at ALD Al2O3/Si Interfaces in Dopant-Free Silicon Photovoltaics
- Kim, Geonhwi ;
- Park, Soohyeok ;
- Hong, Sang-Beom ;
- Han, Yejin ;
- Jeong, Jihwan ;
- ... Kim, Si Joon ;
- ... Um, Han-Don ;
- 외 8명
- 2026-08-25
- Advanced Materials
- WILEY-V C H VERLAG GMBH
Article
Effect of Annealing Ramp-Up Rate on the Ferroelectric Properties of Hf0.5Zr0.5O2 Capacitors
- Park, Seongbin ;
- Lee, Minjong ;
- Kang, Jongmug ;
- Lee, Seungbin ;
- Min, Hyeonhong ;
- ... Um, Han-Don ;
- ... Kim, Si Joon ;
- 외 10명
- 2026-08-09
- physica status solidi (a) - applications and materials science
- WILEY-V C H VERLAG GMBH
Article
Field-Induced Enhancement of Ferroelectric Switching in Hf0.5Zr0.5O2 Capacitors under Cryogenic Conditions
- Lee, Seungbin ;
- Lee, Minjong ;
- Choi, Yeseo ;
- Park, Hye Ryeon ;
- Kang, Jongmug ;
- ... Kim, Si Joon ;
- 외 8명
- 2026-04-14
- ACS APPLIED ELECTRONIC MATERIALS
- AMER CHEMICAL SOC
Conference
Cryogenic switching behavior of ferroelectric TiN/HZO/TiN capacitors
- 김시준 ;
- 김예찬 ;
- 이승빈 ;
- 민현홍 ;
- 장광현
- 2026-01-27
- 대한민국
Conference
Effect of electrode work-function asymmetry on built-in fields in ferroelectric ALD-HZO thin films
- 2026-01-27
- 대한민국
Conference
Wake-up-free ferroelectricity in Zr-rich HZO via asymmetric loop operation
- 김시준 ;
- 김예찬 ;
- 이승빈 ;
- 민현홍 ;
- 장광현
- 2026-01-27
- 대한민국
Conference
Analysis of chlorine-induced threshold voltage instability in IGZO TFTs
- 김시준 ;
- 김예찬 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- 외 1명
- 2026-01-27
- 대한민국
Conference
Cryogenic performance and reliability of IGZO thin-film transistors
- 김시준 ;
- 이호민 ;
- 송민섭 ;
- 김예찬 ;
- 김인성 ;
- 외 4명
- 2026-01-27
- 대한민국
Conference
Investigation of low-temperature behavior of IGZO thin-film transistors with tunable oxygen vacancies
- 김시준 ;
- 김예찬 ;
- 이승빈 ;
- 민현홍 ;
- 장광현
- 2026-01-20
- 대한민국