상세 보기
자료 필터
자료유형
발행연도
2013 ~ 2026
2013 2026
키워드
언어
전체 158건 중 11번부터 20번까지의 결과를 표시합니다.
2026
Conference
Effects of process-induced chlorine on electrical characteristics and reliability of IGZO thin-film transistors
- 김시준 ;
- 김예찬 ;
- 김호영 ;
- 이승빈 ;
- 민현홍 ;
- 외 2명
- 2026-01-20
- 대한민국
Article
Pulse-Width-Dependent Imprint Effect in Ferroelectric Hf0.5Zr0.5O2 Capacitors
- Lee, Minjong ;
- Mohan, Jaidah ;
- Narayan, Dushyant M. ;
- Jung, Yong Chan ;
- Park, Seongbin ;
- ... Kim, Si Joon ;
- 외 5명
- 2026-01
- physica status solidi (RRL) - Rapid Research Letters
- WILEY-V C H VERLAG GMBH
2025
Conference
High-k gate insulator engineering for low-voltage and reliable top-gated IGZO-FETs
- 김시준 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- Minjong Lee ;
- 외 5명
- 2025-12-11
- 미국
Article
Experimental Demonstration of Capacitive in-Memory Computing Using Ferroelectric HZO Memcapacitors
- Lee, Minjong ;
- Hernandez-arriaga, Heber ;
- Narayan, Dushyant M. ;
- Shirodkar, Soham ;
- Jung, Yong Chan ;
- ... Kim, Si Joon ;
- 외 7명
- 2025-12
- Advanced Electronic Materials
- WILEY-V C H VERLAG GMBH
Conference
Ramp-up rate engineering to enhance ferroelectric HZO for in-memory computing
- 김시준 ;
- 박성빈 ;
- 강종묵 ;
- 이승빈 ;
- 민현홍 ;
- 외 1명
- 2025-11-27
- 대한민국
Conference
Thermal and electrical stability of metal electrodes for high-reliability space transformer substrates in wafer-level testing
- 김시준 ;
- 이호민 ;
- 송민섭 ;
- 김예찬 ;
- 김호영 ;
- 외 3명
- 2025-11-26
- 대한민국
Conference
Top electrode engineering for controlling ferroelectric properties of ALD-HZO thin films
- 김시준 ;
- 이호민 ;
- 송민섭 ;
- 이승빈 ;
- 민현홍 ;
- 외 1명
- 2025-07-09
- 대한민국
Article
Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors
- Na, Jae Won ;
- Lee, Seungbin ;
- Min, Hyeonhong ;
- Jang, Gwanghyeon ;
- Song, Minseop ;
- ... Kim, Si Joon ;
- 외 4명
- 2025-06-26
- ACS APPLIED ELECTRONIC MATERIALS
- AMER CHEMICAL SOC
Conference
Machine learning-driven thermal budget analysis for ferroelectric Hf0.5Zr0.5O2 capacitors
- 김시준 ;
- 강종묵 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- 외 5명
- 2025-06-24
- 대한민국
Conference
Integrating machine learning into atomic layer deposition: a case study on hafnium oxide process optimization
- 김시준 ;
- Minjong Lee ;
- Doo San Kim ;
- Thi Thu Huong Chu ;
- Dushyant M. Narayan ;
- 외 3명
- 2025-06-23
- 대한민국