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자료 필터
자료유형
발행연도
2013 ~ 2026
2013 2026
키워드
언어
전체 158건 중 21번부터 30번까지의 결과를 표시합니다.
2025
Conference
A study on the influence of chlorine concentration on electrical stability of IGZO thin-film transistors
- 김시준 ;
- 송민섭 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- 외 1명
- 2025-06-19
- 대한민국
Conference
A study on cryogenic characterization of IGZO thin-film transistors
- 김시준 ;
- 이호민 ;
- 이승빈 ;
- 민현홍 ;
- 장광현
- 2025-06-19
- 대한민국
Conference
Analysis of low-temperature crystallization of ferroelectric ALD-HZO thin films with Avrami constant calculation
- 김시준 ;
- 강종묵 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- 외 2명
- 2025-06-18
- 대한민국
Conference
A study on the voltage-dependent ferroelectric characterization of ALD-HZO thin films under cryogenic conditions
- 김시준 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- Minjong Lee ;
- 외 1명
- 2025-06-18
- 대한민국
Conference
Comprehensive analysis of the effects of metal precursors and oxygen sources on ferroelectric ALD-HZO thin films
- 김시준 ;
- 이승빈 ;
- 민현홍 ;
- 장광현 ;
- Jiyoung Kim
- 2025-06-18
- 대한민국
Article
Enhanced electrical stability in IGZO TFTs through passivation effects of PTFE in the back-channel layer
- Na, Jae Won ;
- Moon, Kunho ;
- Lee, I. Sak ;
- Park, Kyungho ;
- Kim, Hwa Seon ;
- ... Kim, Si Joon ;
- 외 1명
- 2025-05-12
- Applied Physics Letters
- AIP Publishing
Conference
Thermal budget analysis of ferroelectric ALD-(Hf,Zr)O2 thin films using the JMAK model
- 김시준 ;
- 김재훈 ;
- 강종묵 ;
- 이승빈 ;
- 민현홍 ;
- 외 3명
- 2025-04-09
- 미국
Conference
Influence of W and TiN electrodes on ferroelectric ALD-(Hf,Zr)O2 capacitors at cryogenic temperatures
- 김시준 ;
- 김재훈 ;
- 강종묵 ;
- 이승빈 ;
- Jin-Hyun Kim ;
- 외 3명
- 2025-04-09
- 미국
Article
Impact of Tetrakis(ethylmethylamino)-based precursor and oxygen source selection on atomic layer deposition of ferroelectric HfxZr1-xO2 thin films
- Kim, Jin-Hyun ;
- Song, Siun ;
- Narayan, Dushyant M. ;
- Le, Dan N. ;
- Chu, Thi Thu Huong ;
- ... Kim, Si Joon ;
- 외 8명
- 2025-03-30
- Applied Surface Science
- ELSEVIER
Article
Thermal budget study to simultaneously achieve low-temperature (<400 °C) process and high endurance of ferroelectric Hf0.5Zr0.5O2 thin films
- Kang, Jongmug ;
- Park, Seongbin ;
- Park, Hye Ryeon ;
- Lee, Seungbin ;
- Kim, Jin-Hyun ;
- ... Kim, Si Joon ;
- 외 8명
- 2025-03
- Applied Physics Letters
- AIP Publishing